Curriculum Vitae

8 March 1976   Born in Hamburg, Germany
May 1995   General qualification for university entrance (Abitur) from Gymnasium Tostedt
Aug. 1995 - Aug. 1996   Civil service (Kreiskrankenhaus Buchholz)
Oct. 1996 - Sept. 2000   Study of mathematics at the University of Hamburg, Germany
Aug. 2000   Dipl.-Math. (Master's degree) in mathematics
Supervisor: Prof. Dr. U. Eckhardt
Title of the thesis: Verbandstheoretische Grundlagen der mathematischen Morphologie
Oct. 2000 - Sept. 2001   Ph.D. scholarship from the Technische Universität München, Germany
Oct. 2001 - Sept. 2004   Scientific employee at the Department of Mathematics, Technische Universität München, Germany
Oct. 2003 - Nov. 2003   Visiting scientist at the University College London, UK
Dec. 2003   Ph.D. degree in mathematics (Dr. rer. nat.)
Supervisor: Prof. Dr. Peter Gritzmann
Title of Ph.D. thesis: Instability and Stability in Discrete Tomography
Sept. 2004 - Oct. 2004   Visiting scientist at Risø National Laboratory, Denmark (Materials Research Department)
Nov. 2004 - Feb. 2005   Research scholar at the City University of New York, USA (Prof. G. T. Herman)
Mar. 2005 - May 2007
  Visiting scientist at the School of Operations Research and Industrial Engineering, Cornell University, USA (Prof. L. Trotter)
supported by a Feodor Lynen Research Fellowship from the Alexander von Humboldt Foundation
Aug. 2007 - Dec. 2007
  Visiting assistant professor at the School of Operations Research and Information Engineering, Cornell University, USA
June 2007 - June 2010
  Assistant professor at the Technical University of Denmark (DTU), Materials Research Department & Department of Informatics and Mathematical Modelling
July 2010 - April 2011
  Assistant professor (German: Akad. Rat, Vertr.) at the Department of Mathematics, Technische Universität München, Germany
May 2011 - present

  Scientist at the Department of Mathematics, Technische Universität München, Germany (Principal Investigator [jointly with P. Gritzmann] for DFG project Geometric Reconstruction in Refraction- and Diffraction-based Tomography)